Simulation of Electron Energy Spectra of a Biased Paracentric Hemispherical Deflection Analyzer as a Function of Entry Bias: Effects of Misalignments
Figure 1
A visual representation of the focusing capability, the image size, and dispersion at the detector produced by two bundles of electrons formed by 100,000 inputs, in which the particle initial conditions are generated by a random process with two pass energies eV and eV, and for an extended source of mm and for (a) mm, (b) mm, and (c) mm, respectively. A hemispherical deflection analyzer creates a focus in both dispersive (-axis) and nondispersive (-axis) directions. A large dispersion and small trace width increase energy resolution.
