ZnO/ZnAl<sub>2</sub>O<sub>4</sub> Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

<div>Typical XRD pattern of the ZnO/ZnAl<sub>2</sub>O<sub>4 </sub>nanocomposite films annealed during 1 h at (a) 700°C and (b) 650°C.</div>

Journal of Spectroscopy

Figure 3: ZnO/ZnAl<sub>2</sub>O<sub>4</sub> Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy 