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Journal of Spectroscopy
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Journal of Spectroscopy
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2015
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Article
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Fig 3
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Research Article
ZnO/ZnAl
2
O
4
Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy
Figure 3
Typical XRD pattern of the ZnO/ZnAl
2
O
4
nanocomposite films annealed during 1 h at (a) 700°C and (b) 650°C.
(a)
(b)