Journal of Spectroscopy / 2015 / Article / Fig 3

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Figure 3

Typical XRD pattern of the ZnO/ZnAl2O4 nanocomposite films annealed during 1 h at (a) 700°C and (b) 650°C.
(a)
(b)

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