Journal of Spectroscopy / 2015 / Article / Fig 5

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Figure 5

XPS survey spectrum of the as-deposited ZnO/ZnAl2O4 film annealed at 700°C for 1 h.

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