ZnO/ZnAl<sub>2</sub>O<sub>4</sub> Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

<div>XPS survey spectrum of the as-deposited ZnO/ZnAl<sub>2</sub>O<sub>4</sub> film annealed at 700°C for 1 h.</div>

Journal of Spectroscopy

Figure 5: ZnO/ZnAl<sub>2</sub>O<sub>4</sub> Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy 