ZnO/ZnAl₂O₄ Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Table 2

XPS binding energies (eV) for zinc reference compounds and ZnO/ZnAl₂O₄ system (annealed at 700°C). ^aAs-deposited film, ^bsurface cleaned film, and Auger values in kinetic energy (KE). Zinc Auger parameter = binding energy Zn 2p3/2 + kinetic energy Zn LMM.

Sample	Zn 2p3/2	Zn LMM; Auger	Zn Auger; parameter	Zn 2p1/2	Zn 3p	Zn 3s	O 1s	Al 2p	Al 2s	S 2p	S 2s	C 1s
ZnO [6]	1021.5	988.6	2010.1	1044.6	88.6	139.5	530.2	/	/	/	/	285.1
ZnAl2O4 [6]	1022.0	987.5	2009.5	1045.1	89.4	140.3	531.3	74.5	119.3	/	/	285.1
Iaiche et al.	1022.7	987.4	2010.1	1045.9	89.5	140.3	531.9	74.7	119.5	233.5	169.5	285.1
Iaiche et al.	1022.0	988.2	2010.2	1045.2	89.2	140.0	530.9	74.0	118.8	/	169.2	285.1