Journal of Spectroscopy / 2015 / Article / Tab 2

Research Article

ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Table 2

XPS binding energies (eV) for zinc reference compounds and ZnO/ZnAl2O4 system (annealed at 700°C). aAs-deposited film, bsurface cleaned film, and Auger values in kinetic energy (KE). Zinc Auger parameter = binding energy Zn 2p3/2 + kinetic energy Zn LMM.

SampleZn 2p3/2Zn LMM
Auger
Zn Auger
parameter
Zn 2p1/2Zn 3pZn 3sO 1sAl 2pAl 2sS 2pS 2sC 1s

ZnO [6]1021.5988.62010.11044.688.6139.5530.2////285.1
ZnAl2O4 [6]1022.0987.52009.51045.189.4140.3531.374.5119.3//285.1

Iaiche et al.
1022.7987.42010.11045.989.5140.3531.974.7119.5233.5169.5285.1

Iaiche et al.
1022.0988.22010.21045.289.2140.0530.974.0118.8/169.2285.1

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