ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy
XPS binding energies (eV) for zinc reference compounds and ZnO/ZnAl2O4 system (annealed at 700°C). aAs-deposited film, bsurface cleaned film, and Auger values in kinetic energy (KE). Zinc Auger parameter = binding energy Zn 2p3/2 + kinetic energy Zn LMM.
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