Journals
Publish with us
Publishing partnerships
About us
Blog
Journal of Spectroscopy
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Journal of Spectroscopy
/
2016
/
Article
/
Tab 1
/
Research Article
Photoreflectance and Raman Study of Surface Electric States on AlGaAs/GaAs Heterostructures
Table 1
Cap layer thickness, surface electric field (
) obtained from PR measurements, and
/
ratio calculated from Raman measurements.
Sample
Cap (nm)
Si (ML)
(10
7
V/m)
/
M1
25
0
5.99
0.1699
M2
60
0
3.57
0.1407
M3
80
0
3.40
0.1345
M4
25
1
5.91
0.1896
M5
25
2
5.08
0.1772