Research Article

Photoreflectance and Raman Study of Surface Electric States on AlGaAs/GaAs Heterostructures

Table 1

Cap layer thickness, surface electric field () obtained from PR measurements, and / ratio calculated from Raman measurements.

SampleCap (nm)Si (ML) (107 V/m)/

M12505.990.1699
M26003.570.1407
M38003.400.1345
M42515.910.1896
M52525.080.1772