Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF

<div>Thickness determined by PXRF for all the samples of V<sub>2</sub>O<sub>5</sub> versus that determined by the deposited mass.</div>

Journal of Spectroscopy

Figure 10: Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF 