Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF

<div>Theoretical attenuation according to (<a href="https://static.hindawi.com/articles/jspec/volume-2016/9509043/figures/#EEq1">1</a>) for the Ca-K<i>α</i> (3.69 keV) through the vanadium film.</div>

Journal of Spectroscopy

fig5

Figure 5

Figure 5: Thickness Measurement of V<sub>2</sub>O<sub>5</sub> Nanometric Thin Films Using a Portable XRF 

Journal of Spectroscopy

Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF

Figure 5

Thickness Measurement of V₂O₅ Nanometric Thin Films Using a Portable XRF