Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 10
Intensity distributions of Raman modes in the HV case under the oblique backscattering configuration (β = 30°) for different polarization directions φ and sample rotation angles: (a) α = 0°, (b) α = 15°, (c) α = 30°, and (d) α = 45°.
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