Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 13
Intensity distributions of Raman modes in the HH case under off-axis scattering (βI = 30°, βS = 0°) for different polarization directions φ and sample rotation angles: (a) α = 0° and (b) α = 30°.
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(b) |