Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

<div>Intensity distributions of Raman modes in the HV case under off-axis scattering (<i>β</i><sub>I</sub> = 30°, <i>β</i><sub>S</sub> = 0°) for different polarization directions <i>φ</i> and sample rotation angles: (a) <i>α</i> = 0° and (b) <i>α</i> = 30°.</div>

Journal of Spectroscopy

fig14

Figure 14

Figure 14: Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon 