Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 15
Intensity distributions of Raman modes of (110) c-Si in the HH case for different polarization directions φ and sample rotation angles α under (a) vertical backscattering (β = 0°), (b) off-axis scattering (β = 30°), and (c) oblique backscattering (βI = 30°, βS = 0°).
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