Correlation between Photoluminescence Properties of Surface Defects and Laser-Induced Damage Threshold of Fused Silica

Figure 3

(a) PL spectra of the fused silica sample with 514.5 nm excitation. Curve #1: pristine region, curve #2: the edge region of the laser-induced damaged site, and curve #3: the ion beam etching-treated region. The inset is the microscopic image of the selected damage site. (b) The magnification of the inset. (c) The microscopic image of the etching region.

(a)

(b)

(c)