Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 4

Lot information.

𝑖	𝐺𝑖	𝑟𝑖
1	1	1800
2	1,2,3	2770
3	8,9	1800
4	1,2,3,4,5	3560
5	3,4,5,6	1736
6	5,6,7,8	1672