Scheduling Semiconductor Multihead Testers Using Metaheuristic Techniques Embedded with Lot-Specific and Configuration-Specific Information

Table 9

The ANOVA table.

Source	Sum of squares	df	Mean square	𝐹	Sig.
HEAD	0.392	2	1.96𝐸−01	584.5335	0.000
METHOD	0.448	12	3.70𝐸−02	111.0758	0.000
MAC	0.86	1	0.86	2559.29	0.000
LOT_R	6.40𝐸−02	1	6.40𝐸−02	192.7445	0.000
T_H_R	1.19𝐸−01	2	5.99𝐸−02	178.48	0.000
RANGE	1.24𝐸−02	1	1.90𝐸−01	567.7516	0.000
Error	3.0378	9010	3.37𝐸−04