Research Article

Quality-Related Process Monitoring Based on Total Kernel PLS Model and Its Industrial Application

Table 6

False alarm rates of TEP using T-PLS, KPLS, and T-KPLS (%).

Faults ID Type T-PLS KPLS T-KPLS

IDV(0) 5.2 8.6 5.9
IDV(3) Step 5.9 9.8 5.9
IDV(4) Step 33.5 25.3 17.2
IDV(9) Step 5.3 8.2 4.4
IDV(11) Random variation 32.3 32.7 17.8
IDV(14) Random variation 12.4 22.7 7.8
IDV(15) Slow drift 5.3 28.0 10.0