Investigation of Novel Noncontacting Measurement Method by the Design of Loop-Type Probe and Reconstruction of Radiation Modeling

Table 1

Six package designs for investigating electrical effects.

Probe type	Performance
	Cost	Mobility	Probability of damaging the DUT	Probability of damaging the probe
Air coplanar probe	High	Medium	Medium	Medium
Cantilevered probe	High	Medium	High	High
Spring contact probe	High	High	Low	Low
SMA connector	Low	Low	High	High
Noncontacting loop-type probe	Low	High	Extremely low	Extremely low