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Mathematical Problems in Engineering
Volume 2015 (2015), Article ID 707358, 11 pages
http://dx.doi.org/10.1155/2015/707358
Research Article

Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing

Department of Information Management and Innovation Center for Big Data & Digital Convergence, Yuan Ze University, Chungli, Taoyuan 32003, Taiwan

Received 30 October 2014; Revised 27 January 2015; Accepted 28 January 2015

Academic Editor: Chiwoon Cho

Copyright © 2015 Chia-Yu Hsu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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