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Mathematical Problems in Engineering
Volume 2016 (2016), Article ID 7305702, 7 pages
Research Article

Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits

The Higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations of Heilongjiang Province, Harbin University of Science and Technology, Harbin 150080, China

Received 1 March 2016; Accepted 20 April 2016

Academic Editor: Anna Vila

Copyright © 2016 Xinmiao Lu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Aiming at the nonstationarity and nonlinearity of soft fault signals of nonlinear analog circuits, the use of multifractal detrended fluctuation analysis can effectively reveal the dynamic behavior hidden in multiscale nonstationary signals. This paper adopts a new method that uses multifractal detrended fluctuation analysis to calculate the multifractal singularity spectrum of soft fault signals of nonlinear analog circuits. Moreover, this method endows the parameters of the spectrum with definite physical meanings including width, maximum singular index, minimum singular index, and corresponding singularity index of the extreme point. Therefore, this method can be applied to characterize the internal dynamic mechanism of the soft fault signals of nonlinear analog circuits, making it suitable for the feature extraction of fault circuits. All multifractal feature parameters can be organized into a feature set, which will be then input to a support vector machine, and fault detection for the nonlinear analog circuit can be conducted via the support vector machine.