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Mathematical Problems in Engineering
Volume 2016, Article ID 8207685, 6 pages
http://dx.doi.org/10.1155/2016/8207685
Research Article

Generation of Multispot PSF for Scanning Structured Illumination via Phase Retrieval

1W. M. Keck Center for Adaptive Optical Microscopy, Jack Baskin School of Engineering, University of California, Santa Cruz, CA 95064, USA
2State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering and the Collaborative Innovation Center for Brain Science, Zhejiang University, Hangzhou, Zhejiang 310027, China

Received 14 September 2016; Revised 21 November 2016; Accepted 1 December 2016

Academic Editor: Michael Mazilu

Copyright © 2016 Alex Bardales et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

In this work, we propose a structured illumination (SI) method based on a two-photon excitation (TPE) scanning laser beam. Advantages of TPE methods include optical sectioning, low phototoxicity, and robustness in the face of sample-induced scattering. We designed a novel multispot point spread function (PSF) for a fast, two-photon scanning SIM microscope. Our multispot PSF is generated with a phase retrieval algorithm. We show how to obtain the phase distribution and then simulate the effect of this distribution on a spatial light modulator (SLM), which produces the multispot PSF in the object plane of the microscope. We produce simulations that show the viability of this method. The results are simulated and a multispot PSF scanning SIM microscope is proposed.