Generation of Multispot PSF for Scanning Structured Illumination via Phase Retrieval

Figure 6

A demonstration of the reconstruction with our method. Image (a) is the ground truth image, from [6]. Image (b) is what would be visible with a conventional, wide-field microscope: the image is blurred with the PSF of the microscope, and white noise is added at 20% of peak image intensity. The SIM reconstruction (c) is shown using the TPE scanning SIM pattern obtained in this section.

(a) Ground truth

(b) Blurred image with noise

(c) Reconstruction