Deformation Monitoring System Based on 2D-DIC for Cultural Relics Protection in Museum Environment with Low and Varying Illumination

Table 1

Specific parameters for different speckle patterns.

Speckle pattern	Illumination (lux)	Exposure time (ms)
A	60	100
B	60	50
C	40	100
D	80	50
E	60	100
F	60	50
G	40	100
H	80	50