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Mathematical Problems in Engineering
Volume 2018, Article ID 9714206, 11 pages
Research Article

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

1School of Instrumentation Science and Opto-Electronics Engineering, Beihang University, 37 Xueyuan Road, Beijing 100191, China
2School of Physics and Electronic Information, Huaibei Normal University, 100 Dongshan Road, Huaibei 235000, China

Correspondence should be addressed to Qingfeng Ma; moc.qq@efiqam

Received 17 September 2017; Revised 20 December 2017; Accepted 8 January 2018; Published 4 February 2018

Academic Editor: Konstantinos Karamanos

Copyright © 2018 Qingfeng Ma et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The demand for testability analysis has increased with the integration densities and complexity of circuits. As an important part of testability analysis, the test point selection method needs to be researched in depth. A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution. Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table. Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree. The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.