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Mathematical Problems in Engineering
Volume 2018, Article ID 9714206, 11 pages
https://doi.org/10.1155/2018/9714206
Research Article

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

1School of Instrumentation Science and Opto-Electronics Engineering, Beihang University, 37 Xueyuan Road, Beijing 100191, China
2School of Physics and Electronic Information, Huaibei Normal University, 100 Dongshan Road, Huaibei 235000, China

Correspondence should be addressed to Qingfeng Ma; moc.qq@efiqam

Received 17 September 2017; Revised 20 December 2017; Accepted 8 January 2018; Published 4 February 2018

Academic Editor: Konstantinos Karamanos

Copyright © 2018 Qingfeng Ma et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Linked References

  1. J. A. Starzyk, D. Liu, Z.-H. Liu, D. E. Nelson, and J. O. Rutkowski, “Entropy-based optimum test points selection for analog fault dictionary techniques,” IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 3, pp. 754–761, 2004. View at Publisher · View at Google Scholar · View at Scopus
  2. H. Luo, Y. Wang, H. Lin, and Y. Jiang, “A new optimal test node selection method for analog circuit,” Journal of Electronic Testing, vol. 28, no. 3, pp. 279–290, 2012. View at Publisher · View at Google Scholar · View at Scopus
  3. D. Zhao and Y. He, “A new test point selection method for analog circuit,” Journal of Electronic Testing: Theory and Applications, vol. 31, no. 1, pp. 53–66, 2015. View at Publisher · View at Google Scholar · View at Scopus
  4. K. C. Varghese, J. Hywel Williams, and D. R. Towill, “Computer aided feature selection for enhanced analogue system fault location,” Pattern Recognition, vol. 10, no. 4, pp. 265–280, 1978. View at Publisher · View at Google Scholar · View at Scopus
  5. W. Hochwald and J. D. Bastian, “A DC approach for analog fault dictionary determination,” IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 26, no. 7, pp. 523–529, 1979. View at Publisher · View at Google Scholar · View at Scopus
  6. P. M. Lin and Y. S. Elcherif, “Analogue circuits fault dictionary—new approaches and implementation,” International Journal of Circuit Theory and Applications, vol. 13, no. 2, pp. 149–172, 1985. View at Publisher · View at Google Scholar · View at Scopus
  7. J. Van Spaandonk and T. A. M. Kevenaar, “Iterative test-point selection for analog circuits,” in Proceedings of the 14th IEEE VLSI Test Symposium, pp. 66–71, New Jersey, USA, May 1996. View at Scopus
  8. V. C. Prasad and N. S. C. Babu, “Selection of test nodes for analog fault diagnosis in dictionary approach,” IEEE Transactions on Instrumentation and Measurement, vol. 49, no. 6, pp. 1289–1297, 2000. View at Publisher · View at Google Scholar · View at Scopus
  9. T. Golonek and J. Rutkowski, “Genetic-algorithm-based method for optimal analog test points selection,” IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 54, no. 2, pp. 117–121, 2007. View at Publisher · View at Google Scholar · View at Scopus
  10. C. Yang, S. Tian, and B. Long, “Application of heuristic graph search to test-point selection for analog fault dictionary techniques,” IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 7, pp. 2145–2158, 2009. View at Publisher · View at Google Scholar · View at Scopus
  11. Y. Gao, C. Yang, S. Tian, and F. Chen, “Entropy based test point evaluation and selection method for analog circuit fault diagnosis,” Mathematical Problems in Engineering, vol. 2014, Article ID 259430, 16 pages, 2014. View at Publisher · View at Google Scholar · View at Scopus
  12. H. Lei and K. Qin, “Greedy randomized adaptive search procedure for analog test point selection,” Analog Integrated Circuits and Signal Processing, vol. 79, no. 2, pp. 371–383, 2014. View at Publisher · View at Google Scholar · View at Scopus
  13. Q. Ma, Y. He, and F. Zhou, “Multi-objective fruit fly optimization algorithm for test point selection,” in Proceedings of the 2016 IEEE Advanced Information Management, Communicates, Electronic and Automation Control Conference, IMCEC 2016, pp. 272–276, Xi’an, China, October 2016. View at Publisher · View at Google Scholar · View at Scopus
  14. C. Yang, S. Tian, B. Long, and F. Chen, “A novel test point selection method for analog fault dictionary techniques,” Journal of Electronic Testing, vol. 26, no. 5, pp. 523–534, 2010. View at Publisher · View at Google Scholar · View at Scopus
  15. G. Zhang, L. Hu, and W. Jin, “Resemblance coefficient and a quantum genetic algorithm for feature selection,” Lecture Notes in Computer Science, vol. 3245, pp. 155–168, 2004. View at Google Scholar · View at Scopus