A New Lifetime Exponential-X Family of Distributions with Applications to Reliability Data

Table 5

The goodness-of-fit measures of the competing models for data 1.

Dist.	AD	CM	KS	value
NLTE-W	2.283	0.501	0.146	0.421
Weibull	3.334	0.547	0.199	0.401
EW	2.921	0.468	0.201	0.592
APTW	3.141	0.539	0.183	0.409
TW	3.246	0.530	0.188	0.407
FWE	3.476	0.598	0.201	0.386