Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process

Table 6

: constant stress accelerated degradation test plan.

The optimal test plan				The traditional test plan
Temperature stress T(°C)	Sample distribution ratio	Test frequency ()	Variance factor	Temperature stress T(°C)	Sample distribution ratio	Test frequency ()	Variance factor
119	0.483	1.9	1.17	105	0.2	2.29	1.36
128	0.127	1.06		117	0.2	2.29
138	0.13	0.85		130	0.2	2.29
148	0.127	0.81		143	0.2	2.29
158	0.134	0.81		158	0.2	2.29