Research Article
Defect Contour Detection of Complex Structural Chips
| Illumination situation | Machine assessment | Artificial assessment (s) | YOLO v4 (s) | Ours (s) |
| Normal illumination | 9.8 | 15.2 | 57.2 | Weak illumination | 9.4 | 15.9 | 60.7 | Strong illumination | 9.5 | 16.1 | 61.3 |
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