Review Article

Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

Figure 10

The profiles of the time-resolved SF intensity images with pump photon energy 2.33 eV; (a) the nonresonant signal with IR wavenumber 2019 cm−1; (b) the resonant signal with IR wavenumber 2084 cm−1.
576547.fig.0010a
(a)
576547.fig.0010b
(b)