Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

<table>(a)~(e) Nonresonant and (a′)~(e′) resonant SFG images as a function of delay times from 0 to 930 ps with IR light wavenumbers 2019 and 2084 cm<sup>−1</sup>.  (f) The resonant SFG intensity images corresponding to the pump light spot.  (f′) A schematic illustration of expanded areas of modulated SFG signals compared to pump spot size.  Scale bars are 200 <i>μ</i>m.</table>

Physics Research International

fig9

Figure 9

Figure 9: Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions 