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Volume 2017, Article ID 1985149, 11 pages
https://doi.org/10.1155/2017/1985149
Review Article

Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials

1Department of Mechanical and Biomedical Engineering, City University of Hong Kong, Kowloon, Hong Kong
2Centre for Advanced Structural Materials (CASM), Shenzhen Research Institute, City University of Hong Kong, Shenzhen 518057, China
3Centre for Robotics and Automation (CRA), Shenzhen Research Institute, City University of Hong Kong, Shenzhen 518057, China

Correspondence should be addressed to Yajing Shen; kh.ude.uytic@nehsijay and Yang Lu; kh.ude.uytic@ulgnay

Received 18 May 2017; Revised 29 August 2017; Accepted 1 October 2017; Published 25 October 2017

Academic Editor: Daniele Passeri

Copyright © 2017 Chenchen Jiang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Chenchen Jiang, Haojian Lu, Hongti Zhang, Yajing Shen, and Yang Lu, “Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials,” Scanning, vol. 2017, Article ID 1985149, 11 pages, 2017. https://doi.org/10.1155/2017/1985149.