Scanning / 2017 / Article / Fig 1

Review Article

Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials

Figure 1

Typical tensile testing configurations on nanostructures. (a) shows that the sample can be stretched by a custom-milled diamond tension grip in SEM [17]. (b) Push-to-pull micromechanical device which can convert the compression force of the nanoindenter into tensile force [18].
(a)
(b)