Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials

<div>The schematic illustration of different bending tests of thin films. (a) Single point bending test. (b) Three-point double-clamped bending test and (c) four-point double-clamped bending test.</div>

Scanning

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Figure 4

Figure 4: Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials 