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Research Article

Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 10

(a), (b), and (c) EFM () detection electrical signal for PS and PS with 60 nm and 200 nm Al2O3, respectively; (d) Cross-sectional topography profiles and (e) EFM signal for studied PS particles at = 3.5 V and = 30 nm.
(a)
(b)
(c)
(d)
(e)

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