Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

<div>Best <svg height="11.927pt" id="M141" style="vertical-align:-3.291101pt" version="1.1" viewbox="-0.0498162 -8.6359 13.1624 11.927" width="13.1624pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M610 18C585 26 567 34 540 68C517 97 499 128 476 171C452 215 425 276 413 304C496 332 570 394 570 494C570 555 545 595 509 619S419 650 364 650H139L133 622C216 615 219 612 203 527L129 132C112 40 105 36 23 28L17 0H279L285 28C199 34 194 40 211 132L239 284H284C320 284 334 275 351 236C374 182 394 140 420 93C459 23 495 -1 592 -8H600L610 18ZM480 485C480 424 449 372 403 342C374 323 338 316 293 316H245L291 562C296 589 301 601 311 608S337 618 358 618C432 618 480 575 480 485Z" id="g113-83"></path></g><g transform="matrix(.0091,0,0,-0.0091,8.086,3.132)"><path d="M245 635C92 635 37 457 37 312C37 149 91 -12 244 -12C395 -12 449 166 449 312C449 469 395 635 245 635ZM243 598C332 598 358 454 358 312C358 173 334 26 245 26C158 26 128 174 128 313S152 598 243 598Z" id="g50-49"></path></g></svg> fit curve between experimental results and simulation, obtained for a <svg height="11.927pt" id="M142" style="vertical-align:-3.291101pt" version="1.1" viewbox="-0.0498162 -8.6359 13.1624 11.927" width="13.1624pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M610 18C585 26 567 34 540 68C517 97 499 128 476 171C452 215 425 276 413 304C496 332 570 394 570 494C570 555 545 595 509 619S419 650 364 650H139L133 622C216 615 219 612 203 527L129 132C112 40 105 36 23 28L17 0H279L285 28C199 34 194 40 211 132L239 284H284C320 284 334 275 351 236C374 182 394 140 420 93C459 23 495 -1 592 -8H600L610 18ZM480 485C480 424 449 372 403 342C374 323 338 316 293 316H245L291 562C296 589 301 601 311 608S337 618 358 618C432 618 480 575 480 485Z" id="g113-83"></path></g><g transform="matrix(.0091,0,0,-0.0091,8.086,3.132)"><path d="M245 635C92 635 37 457 37 312C37 149 91 -12 244 -12C395 -12 449 166 449 312C449 469 395 635 245 635ZM243 598C332 598 358 454 358 312C358 173 334 26 245 26C158 26 128 174 128 313S152 598 243 598Z" id="g50-49"></path></g></svg> = 13 nm with <svg height="9.62521pt" id="M143" style="vertical-align:-0.6304703pt" version="1.1" viewbox="-0.0498162 -8.99474 9.87315 9.62521" width="9.87315pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M633 674L603 694L553 619C506 650 449 665 390 665C181 665 50 499 50 319C50 208 100 116 171 56L118 -22L145 -45L201 35C251 3 311 -15 374 -15C560 -15 710 120 710 335C710 447 656 541 584 600L633 674ZM217 123C177 176 150 256 150 344C150 534 254 629 367 629C425 629 477 609 517 566L217 123ZM541 537C581 482 610 406 610 305C610 150 542 21 391 21C333 21 277 45 240 92L541 537Z" id="g190-234"></path></g></svg> = 15° and <svg height="9.49473pt" id="M144" style="vertical-align:-0.2063999pt" version="1.1" viewbox="-0.0498162 -9.28833 6.83278 9.49473" width="6.83278pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M499 88L487 113C459 86 422 65 413 65C403 65 403 74 409 98L461 318C487 426 460 448 431 448C408 448 383 441 352 424C305 398 223 344 157 257H155L243 674C249 702 249 712 240 712C227 712 170 680 87 673L82 648H117C155 648 162 644 150 590L23 -4L30 -12C55 -4 81 3 105 8C113 53 131 150 143 187C199 281 323 387 372 387C390 387 393 369 380 311L328 86C313 19 319 -12 347 -12C379 -12 442 24 499 88Z" id="g113-105"></path></g></svg> = 10 <i>μ</i>m.</div>

Scanning

fig14

Figure 14

Figure 14: Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy 