Scanning / 2017 / Article / Fig 5

Research Article

Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 5

Force contrast absolute values between particle-interphase assembly and matrix, for a nanoparticle of = 10, a 25 nm radius, and 20 nm interphase thickness; inset A: particle-interphase assembly detection, inset B: interphase detection (assembly compared to particle alone).

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