Scanning / 2017 / Article / Fig 3

Research Article

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

Figure 3

5 keV SE (a–c) and BSE (d–f) images of SiO2 NPs on ITO160 as a function of the WD given in the images. The image contrast was postprocessed for optimum visibility.