Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

<div>5 keV SE (a–c) and BSE (d–f) images of SiO<sub>2</sub> NPs on ITO160 as a function of the WD given in the images. The image contrast was postprocessed for optimum visibility.</div>

Scanning

fig3

Figure 3

Figure 3: Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure 