Scanning / 2017 / Article / Fig 4

Research Article

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

Figure 4

BSE images of NPs on ITO160 acquired at (a) = 3 keV, (b) = 10 keV, and (c) = 17 keV at a constant WD of 10 mm. The image contrast was postprocessed for optimum visibility.