Scanning / 2018 / Article / Fig 2

Research Article

Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

Figure 2

High-resolution X-TEM image of an YSZ (3 nm)/Au (1 nm)/YSZ (3 nm)/SiO2/n+-Si(100) structure annealed in Ar ambient at 450°C for 1 hour.

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