Scanning / 2018 / Article / Fig 3

Research Article

Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

Figure 3

AFM (a) and current (b) images of individual filaments in the YSZ film with the Au NP array ( = −4 V) after the forming by scanning at .

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