About this Journal
Aims and scope
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.
The Wiley Hindawi Partnership
This journal is published by Hindawi as part of a publishing collaboration with John Wiley & Sons, Inc. It is a fully Open Access journal produced under the Hindawi and Wiley brands.
ISSN: 0161-0457 (Print)
ISSN: 1932-8745 (Online)
Editorial enquiries should be directed to firstname.lastname@example.org.