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Editorial Board

Associate Editors

  • Richard Arinero , Université de Montpellier, France
  • Daniele Passeri, Università di Roma Sapienza, Italy
  • Andrea Picone , Politecnico di Milano, Italy

    Academic Editors

    • Masayuki Abe, Osaka University, Japan
    • David Alsteens, Université Catholique de Louvain, Belgium
    • Igor Altfeder , The Ohio State University, USA
    • Jose Alvarez , Centre National de la Recherche Scientifique, France
    • Renato Buzio , Consiglio Nazionale delle Ricerche, Italy
    • Ovidiu Cretu, National Institute for Materials Science, Japan
    • Nicolas Delorme , Université du Maine, France
    • Hendrix Demers , McGill University, Canada
    • Jonathan R. Felts, Texas A and M University, USA
    • Marina I. Giannotti, CIBER-BBN/University of Barcelona, Spain
    • Sacha Gómez , Universidad Autónoma de Madrid, Spain
    • Federico Grillo , University of St. Andrews, United Kingdom
    • Anton V. Ievlev , Oak Ridge National Laboratory, USA
    • Berndt Koslowski , Ulm University, Germany
    • Jessem Landoulsi , University Pierre & Marie Curie, France
    • Emanuela Margapoti , Universidad Federal de Sao Carlos, Brazil
    • Alessio Morelli, Queen's University Belfast, United Kingdom
    • Jason L. Pitters, National Research Council of Canada, Canada
    • Michela Relucenti , Università di Roma, Italy
    • Francesco Ruffino , University of Catania, Italy
    • Steven R. Schofield, University College London, United Kingdom
    • Andreas Stylianou , University of Cyprus, Cyprus
    • Christian Teichert , University of Leoben, Austria
    • Marilena Vivona , ORC, University of Southampton, United Kingdom
    • Kislon Voïtchovsky , Durham University, United Kingdom
    • Masamichi Yoshimura , Toyota Technological Institute, Japan
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      Acceptance rate40%
      Submission to final decision46 days
      Acceptance to publication22 days
      CiteScore2.800
      Impact Factor1.330
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