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Usage of Scanning Technologies in Additive Manufacturing

Call for Papers

Additive manufacturing (AM), as a process of joining materials to make objects from 3D model data, is revolutionizing the science and engineering fields. With the rising interests and efforts on innovations, AM has been evolving from a prototyping process to a true manufacturing process. Its layer-by-layer characteristics of manufacturing extremely reduce the complexity and production cost of parts or components with intricate geometrical features. Some AM methods even facilitate new materials development due to their special solidification and metallurgical process.

The special layer-by-layer AM process gives rise to extraordinary properties of metal, polymer, and ceramics, compared to conventional manufacturing technologies. Hence, advanced scanning tools, such as scanning electron, scanning probe, and scanning optical microscopies, are highly desired to be utilized for better understanding of the microscopic characteristics of AM products. As of now, a large number of investigations have been initiated or proceeded with respect to this topic. In order to advance the usage of scanning technologies in AM, we cordially invite investigators to contribute original research articles as well as review articles that will stimulate the continuing efforts in this field.

We are particularly interested in articles evaluating current scanning concepts for AM materials; describing advances in scanning techniques for potential application to AM; new insights into application of state-of-the-art scanning technologies to AM; methods and strategies in AM materials characterization.

Potential topics include but are not limited to the following:

  • TEM for crystalline solid characterization of AM materials
  • Application of SEM to AM porosity and defects detection
  • Standardization of using scanning techniques for AM products
  • EBSD for revealing crystal orientation and phase of AM materials
  • Measurements of residual stress, thermal flow, and thermal properties of AM materials
  • Characterization of AM cellular structure using optical microscopy
  • Energy-dispersive X-ray spectroscopy for elemental analysis of AM materials

Authors can submit their manuscripts through the Manuscript Tracking System at

Submission DeadlineFriday, 17 November 2017
Publication DateApril 2018

Papers are published upon acceptance, regardless of the Special Issue publication date.

Lead Guest Editor

  • Haijun Gong, Georgia Southern University, Statesboro, USA

Guest Editors