Table of Contents
Smart Materials Research
Volume 2011, Article ID 374915, 5 pages
http://dx.doi.org/10.1155/2011/374915
Research Article

Asymmetry of Polarization Reversal and Current-Voltage Characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-Substrate Structures

1Institute of Physics, NASU 46, Prospect Nauki, 03680 Kyiv, Ukraine
2IEMN-DOAE-MIMM Team, CNRS, UMR 8520, Bat. P3, Cité Scientifique USTL, 59652 Villeneuve d’Ascq, France

Received 8 November 2011; Revised 19 December 2011; Accepted 22 December 2011

Academic Editor: David Vokoun

Copyright © 2011 S. L. Bravina et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The characterization of the asymmetries of bipolar charge-voltage and current-voltage loops of polarization reversal and unipolar current-voltage curves for Pt/PZT-film/Pt:Ti/SiO2/Si-substrate systems was performed in the dynamic mode. The asymmetry of local deformation-voltage loops was observed by piezoresponse force microscopy. The comparison of the dependences of introduced asymmetry factors for the bipolar charge-voltage and current-voltage loops and unipolar current-voltage curves on drive voltage indicates the interconnection of ferroelectric and electrical space charge transfer asymmetries.