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Shock and Vibration
Volume 2016 (2016), Article ID 2650569, 11 pages
Research Article

Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI

Science and Technology on Reliability and Environmental Engineering Laboratory, Reliability and System Engineering Department, Beihang University, Beijing 100191, China

Received 22 July 2016; Revised 29 September 2016; Accepted 20 October 2016

Academic Editor: Minvydas Ragulskis

Copyright © 2016 Ying Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Prognostic of electronic device under vibration condition can help to get information to assist in condition-based maintenance and reduce life-cycle cost. A prognostic and remaining life prediction method for electronic devices under random vibration condition is proposed. Vibration response is measured and monitored with acceleration sensor and OMA parameters, including vibration resonance frequency, especially first-order resonance frequency, and damping ratio is calculated with cross-power spectrum density (CPSD) method and modal parameter identification (MPI) algorithm. Steinberg vibration fatigue model which considers transmissibility factor is used to predict the remaining life of electronic component. Case study with a test board is carried out and remaining life is predicted. Results show that with this method the vibration response characteristic can be monitored and predicted.