Numerical Exploratory Analysis of Dynamics and Control of an Atomic Force Microscopy in Tapping Mode with Fractional Order

<div>Representation of AFM-TM schematic diagram. (a) Representation of microcantilever beam and (b) representation of analysis tip through a mass-spring-damper model.</div>

Shock and Vibration

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Figure 1

Figure 1: Numerical Exploratory Analysis of Dynamics and Control of an Atomic Force Microscopy in Tapping Mode with Fractional Order 