Table of Contents
Textures and Microstructures
Volume 5 (1982), Issue 3, Pages 153-170

Neutron Diffraction Texture Analysis Using a 2θ-Position Sensitive Detector

1Institut für Metallkunde und Metallphysik, Technische Universität Clausthal, Germany
2Department of Geology and Geophysics, University of California, Berkeley, USA
3Institut Max von Laue—Paul Langevin, Grenoble, France

Received 5 January 1982; Accepted 5 May 1982

Copyright © 1982 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A method for pole figure measurements in textured samples using neutron diffraction and a position sensitive detector is described. The position sensitive detector allows one to record the whole 2ϑ-spectrum of one sample position simultaneously, i.e. in reasonable time. The availability of the complete 2ϑ spectrum allows separation of overlapping peaks by a deconvolution process. A second independent method of peak separation is based on the crystallographic relations between peaks of various indices (hkl). The method allows extraction of the maximum possible information about the texture out of a polycrystal diffraction spectrum. It is thus especially suited to texture studies in materials having complex diffraction spectra with overlapping peaks, i.e. materials with low crystal symmetry and large lattice parameters as they are frequently encountered in geology.