Table of Contents
Textures and Microstructures
Volume 5, Issue 3, Pages 153-170
http://dx.doi.org/10.1155/TSM.5.153

Neutron Diffraction Texture Analysis Using a 2θ-Position Sensitive Detector

1Institut für Metallkunde und Metallphysik, Technische Universität Clausthal, Germany
2Department of Geology and Geophysics, University of California, Berkeley, USA
3Institut Max von Laue—Paul Langevin, Grenoble, France

Received 5 January 1982; Accepted 5 May 1982

Copyright © 1982 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

H. J. Bunge, H. R. Wenk, and J. Pannetier, “Neutron Diffraction Texture Analysis Using a 2θ-Position Sensitive Detector,” Textures and Microstructures, vol. 5, no. 3, pp. 153-170, 1982. https://doi.org/10.1155/TSM.5.153.