The Determination of Crystallographic Textures From Selected Areas of a Specimen by Electron Diffraction
A technique for the determination of partial pole figures with an angular resolution of <3°, from selected areas of a thin foil, is described. A microcomputer, interfaced to an unmodified JEOL 100 CX TEMSCAN electron microscope is used to scan a diffraction pattern over a detector, tilt the specimen in steps of 1.5° over a range of ±50°, and plot the resulting data as a semiquantitative pole figure. The application of the technique to the study of materials which deform inhomogeneously is discussed, and examples are given of pole figures obtained from deformed single phase and two phase aluminium specimens.
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