Table of Contents
Textures and Microstructures
Volume 10 (1989), Issue 4, Pages 375-387
http://dx.doi.org/10.1155/TSM.10.375

Texture Analysis by Neutron Diffraction Using a Linear Position Sensitive Detector

Mineralogical Institute, University of Bonn, Poppelsdorfer Schloß, Bonn D-5300, Germany

Received 17 May 1989

Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Neutron diffraction in connection with a position-sensitive detector is a most powerful technique in texture analysis comparable in time with conventional X-ray laboratory technique. Neutrons measure the global texture of the sample allowing volumes up to several cm3. By using position-sensitive detectors and applying the mathematical procedures of profile analysis multiphase and low symmetry materials can be investigated without serious difficulties. Neutron diffraction experiments operating in transmission record complete diffraction profiles; overlapping lines are unscrambled by profile analysis. Technical and physical specifications of the dedicated detector JULIOS, installed on the texture diffractometer of Bonn University, are given. A hematite ore has been studied by this technique and the results are given.