Dorte Juul Jensen, Torben Leffers, "Fast Texture Measurements Using a Position Sensitive Detector", Texture, Stress, and Microstructure, vol. 10, Article ID 819505, 13 pages, 1989. https://doi.org/10.1155/TSM.10.361
Fast Texture Measurements Using a Position Sensitive Detector
A technique for fast texture determination by neutron diffraction is described. With the technique a complete texture analysis requires from 15 to 45 minutes measuring time and the kinetics of the development in single texture components can be studied with a time resolution of the order of seconds. It is shown how these two measuring principles can be used for in-situ kinetic investigations of recrystallization. Independent of speed, texture measurement by neutron diffraction has an advantage in improved statistics which is examplified by a series of measurements on the early stage of texture development in copper and brass.
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