Texture, Stress, and Microstructure

Texture, Stress, and Microstructure / 1989 / Article

Open Access

Volume 10 |Article ID 819505 | 13 pages | https://doi.org/10.1155/TSM.10.361

Fast Texture Measurements Using a Position Sensitive Detector

Received15 Feb 1989

Abstract

A technique for fast texture determination by neutron diffraction is described. With the technique a complete texture analysis requires from 15 to 45 minutes measuring time and the kinetics of the development in single texture components can be studied with a time resolution of the order of seconds. It is shown how these two measuring principles can be used for in-situ kinetic investigations of recrystallization. Independent of speed, texture measurement by neutron diffraction has an advantage in improved statistics which is examplified by a series of measurements on the early stage of texture development in copper and brass.

Copyright © 1989 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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