Texture, Stress, and Microstructure

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Texture, Stress, and Microstructure / 1990 / Article

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Volume 12 |Article ID 973756 | 19 pages | https://doi.org/10.1155/TSM.12.199

Numerical Calculation of Anisotropic Absorption Factors for Lamellar Two-Phase Structures

Y. S. Liu1 and H. J. Bunge1

1Department of Physical Metallurgy, Technical University of Clausthal, Germany

Received19 Nov 1989

Abstract

X-ray diffraction in a lamellar two-phase material is considered. If the lamellae thicknesses are small compared with the penetration depth of the X-rays then the absorption factor depends on the whole path of incident and reflected beam in both phases. Particularly, it depends on a rotation γ about the diffraction vector s additional to the orientation (αβ) of this vector with respect to the sample. Numerical calculations of the absorption factor A(αβγ) have been carried out for different values of lamellae thicknesses D1D2, absorption coefficients μ1μ2 and lamellae orientations ωρ with respect to the sample surface.

Copyright © 1990 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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